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Quantitative Analysis of the Recovery Process in Pure Iron Using X-ray Diffraction Line Profile Analysis
- Source :
- Materials; Volume 14; Issue 4; Pages: 895, Materials, Vol 14, Iss 895, p 895 (2021), Materials
- Publication Year :
- 2021
-
Abstract
- We conducted quantitative analysis of the recovery process during pure iron annealing using the modified Williamson-Hall and Warren-Averbach methods. We prepared four types of specimens with different dislocation substructures. By increasing the annealing temperature, we confirmed a decrease in dislocation density. In particular, screw-dislocation density substantially decreased in the early stage of the recovery process, while edge-dislocation density gradually decreased as annealing temperature increased. Moreover, changes in hardness during the recovery process mainly depended on edge-dislocation density. Increases in annealing temperature weakly affected the dislocation arrangement parameter and crystallite size. Recovery-process modeling demonstrated that the decrease in screw-dislocation density during the recovery process was mainly dominated by glide and/or cross-slip with dislocation core diffusion. In contrast, the decrease in edge-dislocation density during the recovery process was governed by a climbing motion with both dislocation core diffusion and lattice self-diffusion. From the above results, we succeeded in quantitatively distinguishing between edge- and screw-dislocation density during the recovery process, which are difficult to distinguish using transmission electron microscope and electron backscatter diffraction.
- Subjects :
- Materials science
0211 other engineering and technologies
Analytical chemistry
02 engineering and technology
modified Williamson-Hall and Warren-Averbach methods
lcsh:Technology
recovery
dislocation substructure
pure iron
modeling
Article
Annealing (glass)
Condensed Matter::Materials Science
General Materials Science
Diffusion (business)
lcsh:Microscopy
021102 mining & metallurgy
lcsh:QC120-168.85
lcsh:QH201-278.5
lcsh:T
021001 nanoscience & nanotechnology
Core (optical fiber)
Transmission electron microscopy
lcsh:TA1-2040
X-ray crystallography
lcsh:Descriptive and experimental mechanics
Crystallite
lcsh:Electrical engineering. Electronics. Nuclear engineering
Dislocation
0210 nano-technology
lcsh:Engineering (General). Civil engineering (General)
lcsh:TK1-9971
Electron backscatter diffraction
Subjects
Details
- ISSN :
- 19961944
- Volume :
- 14
- Issue :
- 4
- Database :
- OpenAIRE
- Journal :
- Materials (Basel, Switzerland)
- Accession number :
- edsair.doi.dedup.....a9069fe3c0d9722b3878757f8fa0163b