Back to Search
Start Over
Electrical diagnostics of high voltage devices via high resolution near field analysis
- Source :
- 2016 IEEE Electrical Insulation Conference (EIC), 2016 IEEE Electrical Insulation Conference (EIC), Jun 2016, Montreal, Canada. pp.555-558
- Publication Year :
- 2016
- Publisher :
- IEEE, 2016.
-
Abstract
- We here present our latest developments concerning an optical pigtailed electric field sensor dedicated to the monitoring and the analysis of medium and high voltage devices. This non invasive sensor allow to perform safely the electric field vectorial characterization in the closest vicinity of a device under test. The realized optical probe demonstrates here its potentialities for the diagnostic of a 25 kV monoconductor cable and is also exploited to analyse a default on a 100 kV insulator.
- Subjects :
- [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]
Materials science
business.industry
[SPI.PLASMA]Engineering Sciences [physics]/Plasmas
Electrical engineering
High resolution
High voltage
Near and far field
Insulator (electricity)
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
Temperature measurement
010305 fluids & plasmas
[SPI.ELEC]Engineering Sciences [physics]/Electromagnetism
Electric field
0103 physical sciences
[SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic
Device under test
0210 nano-technology
business
Image resolution
ComputingMilieux_MISCELLANEOUS
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2016 IEEE Electrical Insulation Conference (EIC)
- Accession number :
- edsair.doi.dedup.....a9ce9fc5005d24fd68a18fd61e0a5590
- Full Text :
- https://doi.org/10.1109/eic.2016.7548663