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Dark-field X-ray microscopy for multiscale structural characterization
Dark-field X-ray microscopy for multiscale structural characterization
- Source :
- Nature Communications, Nature Communications, Nature Publishing Group, 2015, 6, 6 p. ⟨10.1038/ncomms7098⟩, 'Nature Communications ', vol: 6, pages: 6098-1-6098-6 (2015), Simons, H, King, A, Ludwig, W, Detlefs, C, Pantleon, W, Schmidt, S, Snigireva, I, Stöhr, F, Snigirev, A & Poulsen, H F 2015, ' Dark-field X-ray microscopy for multiscale structural characterization ', Nature Communications, vol. 6, 6098 . https://doi.org/10.1038/ncomms7098
- Publication Year :
- 2015
- Publisher :
- Nature Pub. Group, 2015.
-
Abstract
- Many physical and mechanical properties of crystalline materials depend strongly on their internal structure, which is typically organized into grains and domains on several length scales. Here we present dark-field X-ray microscopy; a non-destructive microscopy technique for the three-dimensional mapping of orientations and stresses on lengths scales from 100 nm to 1 mm within embedded sampling volumes. The technique, which allows ‘zooming’ in and out in both direct and angular space, is demonstrated by an annealing study of plastically deformed aluminium. Facilitating the direct study of the interactions between crystalline elements is a key step towards the formulation and validation of multiscale models that account for the entire heterogeneity of a material. Furthermore, dark-field X-ray microscopy is well suited to applied topics, where the structural evolution of internal nanoscale elements (for example, positioned at interfaces) is crucial to the performance and lifetime of macro-scale devices and components thereof.<br />The internal structure of materials determines many of their physical and mechanical properties. Here, the authors have developed a non-destructive X-ray microscopy technique for layer-by-layer mapping of crystallographic orientations and stresses to obtain a three-dimensional reconstruction of a material.
- Subjects :
- Diffraction
PLASTIC-DEFORMATION
Annealing (metallurgy)
RECRYSTALLIZATION
General Physics and Astronomy
chemistry.chemical_element
Nanotechnology
02 engineering and technology
DIFFRACTION
01 natural sciences
General Biochemistry, Genetics and Molecular Biology
Article
ELECTRON-MICROSCOPE
Aluminium
TOMOGRAPHY
0103 physical sciences
Microscopy
Nanoscopic scale
[PHYS]Physics [physics]
010302 applied physics
Physics
Multidisciplinary
INDIVIDUAL GRAINS
X-ray
General Chemistry
021001 nanoscience & nanotechnology
Dark field microscopy
CRYSTALS
FRELON CAMERA
chemistry
Chemical physics
REFRACTIVE LENSES
DISLOCATION
METALS
Tomography
0210 nano-technology
MULTIDISCIPLINARY
Subjects
Details
- Language :
- English
- ISSN :
- 20411723
- Volume :
- 6
- Database :
- OpenAIRE
- Journal :
- Nature Communications
- Accession number :
- edsair.doi.dedup.....aab5d197a7b5479c5a2013a0d833d6d7
- Full Text :
- https://doi.org/10.1038/ncomms7098⟩