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Dark-field X-ray microscopy for multiscale structural characterization

Dark-field X-ray microscopy for multiscale structural characterization

Authors :
H. Simons
A. King
W. Ludwig
C. Detlefs
W. Pantleon
S. Schmidt
F. Stöhr
I. Snigireva
A. Snigirev
H. F. Poulsen
DTU, Dept Phys, DK-2800 Lyngby, Denmark
European Synchrotron Radiation Facility (ESRF)
Matériaux, ingénierie et science [Villeurbanne] (MATEIS)
Université Claude Bernard Lyon 1 (UCBL)
Université de Lyon-Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon)
Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)
DTU, Dept Mech Engn, DK-2800 Lyngby, Denmark
Immanuel Kant Baltic Federal University (IKBFU)
Source :
Nature Communications, Nature Communications, Nature Publishing Group, 2015, 6, 6 p. ⟨10.1038/ncomms7098⟩, 'Nature Communications ', vol: 6, pages: 6098-1-6098-6 (2015), Simons, H, King, A, Ludwig, W, Detlefs, C, Pantleon, W, Schmidt, S, Snigireva, I, Stöhr, F, Snigirev, A & Poulsen, H F 2015, ' Dark-field X-ray microscopy for multiscale structural characterization ', Nature Communications, vol. 6, 6098 . https://doi.org/10.1038/ncomms7098
Publication Year :
2015
Publisher :
Nature Pub. Group, 2015.

Abstract

Many physical and mechanical properties of crystalline materials depend strongly on their internal structure, which is typically organized into grains and domains on several length scales. Here we present dark-field X-ray microscopy; a non-destructive microscopy technique for the three-dimensional mapping of orientations and stresses on lengths scales from 100 nm to 1 mm within embedded sampling volumes. The technique, which allows ‘zooming’ in and out in both direct and angular space, is demonstrated by an annealing study of plastically deformed aluminium. Facilitating the direct study of the interactions between crystalline elements is a key step towards the formulation and validation of multiscale models that account for the entire heterogeneity of a material. Furthermore, dark-field X-ray microscopy is well suited to applied topics, where the structural evolution of internal nanoscale elements (for example, positioned at interfaces) is crucial to the performance and lifetime of macro-scale devices and components thereof.<br />The internal structure of materials determines many of their physical and mechanical properties. Here, the authors have developed a non-destructive X-ray microscopy technique for layer-by-layer mapping of crystallographic orientations and stresses to obtain a three-dimensional reconstruction of a material.

Details

Language :
English
ISSN :
20411723
Volume :
6
Database :
OpenAIRE
Journal :
Nature Communications
Accession number :
edsair.doi.dedup.....aab5d197a7b5479c5a2013a0d833d6d7
Full Text :
https://doi.org/10.1038/ncomms7098⟩