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Correlating photovoltaic properties of PTB7-Th:PC71BM blend to photophysics and microstructure as a function of thermal annealing

Authors :
Lethy Krishnan Jagadamma
Victoria Savikhin
Muhammad T. Sajjad
Ifor D. W. Samuel
Michael F. Toney
EPSRC
University of St Andrews. School of Physics and Astronomy
University of St Andrews. Organic Semiconductor Centre
University of St Andrews. Condensed Matter Physics
Publication Year :
2017

Abstract

We acknowledge support from EPSRC (grant number EP/L012294/1) and the European Research Council (grant number 321305). I.D.W.S. also acknowledges a Royal Society Wolfson Research Merit Award. VS acknowledges support from the Office of Naval Research NDSEG fellowship. Research data supporting this paper is available at doi http://dx.doi.org/10.17630/eadf56f3-8c70-47da-ac6d-67f2d78b3f74 Selective optimisation of light harvesting materials and interface properties has brought breakthroughs in power conversion efficiency (11-12 %) of organic photovoltaics (OPVs). However to translate this promising efficiency to economically viable applications, long term stability is a fundamental requirement. A number of degradation pathways, both extrinsic and intrinsic, reduce the long term stability of OPVs. Here, the photovoltaic properties of a highly efficient bulk heterojunction PTB7-Th:PC71BM blend were investigated as a function of thermal annealing. The changes in charge generation, separation, and transport due to thermal annealing were measured and related to changes in the microstructure and photovoltaic performance. A 30 % drop in power conversion efficiency of PTB7-Th:PC71BM blends upon thermal annealing at 150 oC was identified as mainly due to morphological instability induced by strong phase separation of donor and acceptor molecules of the blend films. Based on the insight gained from these investigations, enhanced thermal stability was demonstrated by replacing the PC71BM fullerene acceptor with the non-fullerene acceptor ITIC, for which power conversion efficiency dropped only by 9 % upon thermal annealing at 150 oC. Postprint

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.doi.dedup.....aca0dba61482db9106f1fefb09727487