Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals

Authors :: Jen It Wong
Zhen Liu
Liang Ding
Stevenson Hon Yuen Fung
Yibin Li
Sam Zhang
Zhan Hong Cen
Ming Yang
Tupei Chen
Yang Liu
School of Electrical and Electronic Engineering
Source :: Applied Physics Letters. 92:013102
Publication Year :: 2008
Publisher :: AIP Publishing, 2008.
Abstract: Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc-Al/AlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination. Published version

Subjects :: Materials science
Physics and Astronomy (miscellaneous)
business.industry
Wide-bandgap semiconductor
Conductance
Nitride
Sputter deposition
medicine.disease_cause
Sputtering
Electrical resistivity and conductivity
medicine
Optoelectronics
Thin film
business
Engineering::Electrical and electronic engineering::Nanoelectronics [DRNTU]
Ultraviolet

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