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Fabrication of RF-MEMS switches on LTCC substrates using PECVD a-Si as sacrificial layer
- Source :
- Microelectronic engineering 84 (2007): 1401–1404., info:cnr-pdr/source/autori:Cianci E, Coppa A, Foglietti V, Dispenza M, Buttiglione R, Fiorello AM, Marcelli R, Catoni S, Pochesci D/titolo:Fabrication of RF-MEMS switches on LTCC substrates using PECVD a-Si as sacrificial layer/doi:/rivista:Microelectronic engineering/anno:2007/pagina_da:1401/pagina_a:1404/intervallo_pagine:1401–1404/volume:84
- Publication Year :
- 2007
- Publisher :
- North-Holland, Amsterdam , Paesi Bassi, 2007.
-
Abstract
- RF micromechanical switches are fabricated using dry releasing techniques. LTCC is used as substrate. Amorphous silicon, as an alternative sacrificial layer to silicon dioxide, has been used followed by dry plasma release. The silicon deposition has been optimized to obtain low mechanical stress and allowing thick sacrificial layer deposition. The use of amorphous silicon extends the flexibility of the design of the devices and of the packaging procedure.
- Subjects :
- Amorphous silicon
inorganic chemicals
Materials science
Silicon
Silicon dioxide
chemistry.chemical_element
Substrate (electronics)
complex mixtures
chemistry.chemical_compound
Plasma-enhanced chemical vapor deposition
Electrical and Electronic Engineering
Microelectromechanical systems
business.industry
technology, industry, and agriculture
Ceramic materials
RF MEMS
Condensed Matter Physics
equipment and supplies
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Amorphous solid
stomatognathic diseases
chemistry
Optoelectronics
business
Layer (electronics)
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Microelectronic engineering 84 (2007): 1401–1404., info:cnr-pdr/source/autori:Cianci E, Coppa A, Foglietti V, Dispenza M, Buttiglione R, Fiorello AM, Marcelli R, Catoni S, Pochesci D/titolo:Fabrication of RF-MEMS switches on LTCC substrates using PECVD a-Si as sacrificial layer/doi:/rivista:Microelectronic engineering/anno:2007/pagina_da:1401/pagina_a:1404/intervallo_pagine:1401–1404/volume:84
- Accession number :
- edsair.doi.dedup.....b1dfaa0f299364461ad251ba34aefbb5