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Generative Adversarial Networks for geometric surfaces prediction in injection molding
- Source :
- 2018 IEEE International Conference on Industrial Technology (ICIT), 2018 IEEE International Conference on Industrial Technology (ICIT), IEEE IES, Lyon 1 University, Ampère Lab, Satie Lab, Feb 2018, Lyon, France. pp.1514-1519, ⟨10.1109/ICIT.2018.8352405⟩, ICIT
- Publication Year :
- 2018
- Publisher :
- HAL CCSD, 2018.
-
Abstract
- International audience; Geometrical and appearance quality requirements set the limits of the current industrial performance in injection molding. To guarantee the product’s quality, it is necessary to adjust the process settings in a closed loop. Those adjustments cannot rely on the final quality because a part takes days to be geometrically stable. Thus, the final part geometry must be predicted from measurements on hot parts. In this paper, we use recent success of Generative Adversarial Networks (GAN) with the pix2pix network architecture to predict the final part geometry, using only hot parts thermographic images, measured right after production. Our dataset is really small, and the GAN learns to translate thermography to geometry. We firstly study prediction performances using different image similarity comparison algorithms. Moreover, we introduce the innovative use of Discrete Modal Decomposition (DMD) to analyze network predictions. The DMD is a geometrical parameterization technique using a modal space projection to geometrically describe surfaces. We study GAN performances to retrieve geometrical parameterization of surfaces.
- Subjects :
- Similarity (geometry)
Computer science
ACM: I.: Computing Methodologies/I.4: IMAGE PROCESSING AND COMPUTER VISION/I.4.8: Scene Analysis
02 engineering and technology
Molding (process)
Projection (linear algebra)
Image (mathematics)
Quality prediction
[INFO.INFO-AI]Computer Science [cs]/Artificial Intelligence [cs.AI]
Set (abstract data type)
[STAT.ML]Statistics [stat]/Machine Learning [stat.ML]
ACM: I.: Computing Methodologies/I.4: IMAGE PROCESSING AND COMPUTER VISION/I.4.7: Feature Measurement
0202 electrical engineering, electronic engineering, information engineering
[INFO.INFO-SY]Computer Science [cs]/Systems and Control [cs.SY]
ACM: I.: Computing Methodologies/I.5: PATTERN RECOGNITION/I.5.4: Applications
ComputingMethodologies_COMPUTERGRAPHICS
Injection molding
ACM: I.: Computing Methodologies/I.5: PATTERN RECOGNITION
Network architecture
Generative Adversarial Networks
ACM: I.: Computing Methodologies/I.4: IMAGE PROCESSING AND COMPUTER VISION
Process (computing)
Discrete Modal Decomposition
ACM: I.: Computing Methodologies/I.5: PATTERN RECOGNITION/I.5.4: Applications/I.5.4.0: Computer vision
[INFO.INFO-CV]Computer Science [cs]/Computer Vision and Pattern Recognition [cs.CV]
021001 nanoscience & nanotechnology
ACM: I.: Computing Methodologies/I.2: ARTIFICIAL INTELLIGENCE
Modal
Thermography
ACM: I.: Computing Methodologies/I.2: ARTIFICIAL INTELLIGENCE/I.2.1: Applications and Expert Systems/I.2.1.2: Industrial automation
[INFO.INFO-TI]Computer Science [cs]/Image Processing [eess.IV]
020201 artificial intelligence & image processing
0210 nano-technology
Algorithm
[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing
ACM: I.: Computing Methodologies/I.2: ARTIFICIAL INTELLIGENCE/I.2.6: Learning
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- 2018 IEEE International Conference on Industrial Technology (ICIT), 2018 IEEE International Conference on Industrial Technology (ICIT), IEEE IES, Lyon 1 University, Ampère Lab, Satie Lab, Feb 2018, Lyon, France. pp.1514-1519, ⟨10.1109/ICIT.2018.8352405⟩, ICIT
- Accession number :
- edsair.doi.dedup.....b34f716dee92f7dfe2dc4a353c4a9ac1
- Full Text :
- https://doi.org/10.1109/ICIT.2018.8352405⟩