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Reflectance anisotropy spectroscopy: A probe to explore organic epitaxial growth

Authors :
P. Chiaradia
Marcello Campione
Daniele Braga
V. Chiostri
Claudio Goletti
Adele Sassella
A. Violante
S. Cirilli
Gianlorenzo Bussetti
Luisa Raimondo
Alessandro Borghesi
Bussetti, G
Cirilli, S
Violante, A
Chiostri, V
Goletti, C
Chiaradia, P
Sassella, A
Campione, M
Raimondo, L
Braga, D
Borghesi, A
Source :
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 27:1029-1034
Publication Year :
2009
Publisher :
American Vacuum Society, 2009.

Abstract

Reflectance anisotropy spectroscopy (RAS) is demonstrated to be particularly suitable for studying the deposition of organic epitaxial layers in ultrahigh vacuum by organic molecular beam epitaxy, thanks to its high sensitivity and applicability in situ. In the case of α-quaterthiophene, both homoepitaxy and heteroepitaxy have been monitored, demonstrating the crystallinity of the films up to tens of monolayers and the epitaxial relation to the substrate. In both cases, optical RAS data are compared to the results of ex situ characterization of the same samples by atomic force microscopy.© 2009 American Vacuum Society

Details

ISSN :
15208559 and 07342101
Volume :
27
Database :
OpenAIRE
Journal :
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Accession number :
edsair.doi.dedup.....b3618ae4db426f9e2d5693b3eb4f2606
Full Text :
https://doi.org/10.1116/1.3155399