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Solid–liquid interface analysis with in‐situ Rutherford backscattering and electrochemical impedance spectroscopy
- Source :
- Surface and Interface Analysis 52(2020)12
- Publication Year :
- 2020
- Publisher :
- Wiley, 2020.
-
Abstract
- A novel Rutherford backscattering spectrometry (RBS) method is presented to investigate the interface between a solid surface and a surrounding liquid. The introduced measurement system allows to observe and quantify adsorption at the solid–liquid interface and the formation of the electrochemical double layer (EDL). BaCl2 as a bicomponent electrolyte and a Si3N4 membrane surface are chosen as a model system to prove the capabilities of the setup. The results of these RBS measurements are combined with electrochemical impedance spectroscopy (EIS) to validate the findings for the solid–liquid interface under study. Complementary results and discrepancies regarding the formation of the EDL are discussed. Author keywords: electrochemical double layer, electrochemical impedance spectroscopy, Rutherford backscattering spectroscopy, silicon nitride
- Subjects :
- In situ
Materials science
Analytical chemistry
Surfaces and Interfaces
General Chemistry
Condensed Matter Physics
Rutherford backscattering spectrometry
Surfaces, Coatings and Films
Dielectric spectroscopy
chemistry.chemical_compound
electrochemical impedance spectroscopy
Silicon nitride
chemistry
point of zero charge
Materials Chemistry
Interface analysis
Solid liquid
electrochemical double layer
Subjects
Details
- ISSN :
- 10969918 and 01422421
- Volume :
- 52
- Database :
- OpenAIRE
- Journal :
- Surface and Interface Analysis
- Accession number :
- edsair.doi.dedup.....b4a097d4c840afcf8804aec46f2620f4
- Full Text :
- https://doi.org/10.1002/sia.6835