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Sub-100 μs nanoimprint lithography at wafer scale
- Source :
- Microelectronic engineering 141 (2015): 21–26. doi:10.1016/j.mee.2015.01.002, info:cnr-pdr/source/autori:Tormen, Massimo; Sovernigo, Enrico; Pozzato, Alessandro; Pianigiani, Michele; Tormen, Maurizio/titolo:Sub-100 mu s nanoimprint lithography at wafer scale/doi:10.1016%2Fj.mee.2015.01.002/rivista:Microelectronic engineering/anno:2015/pagina_da:21/pagina_a:26/intervallo_pagine:21–26/volume:141
- Publication Year :
- 2015
-
Abstract
- Display Omitted A full 4¿ wafer is nanopatterned by an ultrafast thermal NIL process in 100µs.Stamps with integrated heater enable ultrafast cycles at very high temperature.The thermal cycle is implemented with a single short very intense current pulse.A new tool for the ultrafast NIL (or pulsed-NIL) process has been developed.The process applies to a wide range of thermoplastic materials. We present here an ultrafast thermal NIL technology, which enables the patterning of full wafers on the 100µs time-scale. This technique makes use of stamps with a heating layer integrated beneath their nanostructured surfaces. Injecting a single, short (
- Subjects :
- Atomic and Molecular Physics, and Optic
Thermoplastic
Materials science
Surfaces, Coatings and Film
Nanoimprint lithography
law.invention
Coatings and Films
High temperature polymer processing
law
Indentation
Atomic and Molecular Physics
Thermal
High throughput
Electronic
Wafer
Optical and Magnetic Materials
Electrical and Electronic Engineering
chemistry.chemical_classification
business.industry
Electronic, Optical and Magnetic Material
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Ultrafast
Surfaces
chemistry
Resist
Optoelectronics
and Optics
business
Ultrashort pulse
Layer (electronics)
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Microelectronic engineering 141 (2015): 21–26. doi:10.1016/j.mee.2015.01.002, info:cnr-pdr/source/autori:Tormen, Massimo; Sovernigo, Enrico; Pozzato, Alessandro; Pianigiani, Michele; Tormen, Maurizio/titolo:Sub-100 mu s nanoimprint lithography at wafer scale/doi:10.1016%2Fj.mee.2015.01.002/rivista:Microelectronic engineering/anno:2015/pagina_da:21/pagina_a:26/intervallo_pagine:21–26/volume:141
- Accession number :
- edsair.doi.dedup.....b5d6f34296739a24c701794e426555d0
- Full Text :
- https://doi.org/10.1016/j.mee.2015.01.002