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Potentialities of some surface characterization techniques for the development of titanium biomedical alloys
- Source :
- Materials Research, Vol 7, Iss 3, Pp 437-444 (2004), Materials Research v.7 n.3 2004, Materials research (São Carlos. Online), Universidade Federal de São Carlos (UFSCAR), instacron:ABM ABC ABPOL, Materials Research, Volume: 7, Issue: 3, Pages: 437-444, Published: SEP 2004
- Publication Year :
- 2004
- Publisher :
- Associação Brasileira de Metalurgia e Materiais (ABM); Associação Brasileira de Cerâmica (ABC); Associação Brasileira de Polímeros (ABPol), 2004.
-
Abstract
- Bone formation around a metallic implant is a complex process that involves micro- and nanometric interactions. Several surface treatments, including coatings were developed in order to obtain faster osseointegration. To understand the role of these surface treatments on bone formation it is necessary to choose adequate characterization techniques. Among them, we have selected electron microscopy, profilometry, atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) to describe them briefly. Examples of the potentialities of these techniques on the characterization of titanium for biomedical applications were also presented and discussed. Unfortunately more than one technique is usually necessary to describe conveniently the topography (scanning electron microsocopy, profilometry and/or AFM) and the chemical state (XPS) of the external layer of the material surface. The employment of the techniques above described can be useful especially for the development of new materials or products.
- Subjects :
- implant surface
Materials science
Scanning electron microscope
Mechanical Engineering
chemistry.chemical_element
Nanotechnology
Condensed Matter Physics
Osseointegration
Characterization (materials science)
characterization techniques
Chemical state
X-ray photoelectron spectroscopy
chemistry
Mechanics of Materials
lcsh:TA401-492
General Materials Science
lcsh:Materials of engineering and construction. Mechanics of materials
Profilometer
titanium
Layer (electronics)
Titanium
Subjects
Details
- Language :
- English
- ISSN :
- 15161439
- Volume :
- 7
- Issue :
- 3
- Database :
- OpenAIRE
- Journal :
- Materials Research
- Accession number :
- edsair.doi.dedup.....bb010dea98b5334c976d9d48c3165e15