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Local Texture Measurements by EBSP. New Computer Procedures

Authors :
D. Juul Jensen
N. H. Schmidt
Source :
Technical University of Denmark Orbit
Publication Year :
1991
Publisher :
Hindawi Limited, 1991.

Abstract

Two new computer procedures for analysis of electron back scattering patterns (EBSP) are presented. One is a semiautomatic procedure for on-line analysis of EBSPs. The other is an image processing procedure for computer identification of bands in an EBSP. These two procedures may be combined for fully automatic indexing of EBSPs.

Subjects

Subjects :
Identification (information)
Computer science
business.industry
Search engine indexing
Fully automatic
Pattern recognition
Image processing
Artificial intelligence
business
Texture (geology)

Details

ISSN :
07303300
Volume :
14
Database :
OpenAIRE
Journal :
Textures and Microstructures
Accession number :
edsair.doi.dedup.....c1c8321212afe742af399183c272ea79
Full Text :
https://doi.org/10.1155/tsm.14-18.97
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