Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors

Authors :: Croes, K.
Simons, V.
Truijen, B.
Roussel, P.
Sever, K.
Artemisia Tsiara
Franco, J.
Absil, P.
Source :: Scopus-Elsevier
Abstract: Dark current degradation mechanisms in Ge VPIN photodetectors were studied. A methodology to estimate the failure percentages has been developed and applied. Degradation/recovery processes and Ea-decrease of Idark after stress suggest increased TAT during degradation.

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