Applications of photoluminescence imaging to dopant and carrier concentration measurements of silicon wafers

MLA

Daniel Macdonald, et al. Applications of Photoluminescence Imaging to Dopant and Carrier Concentration Measurements of Silicon Wafers. Jan. 2013. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....c260a60fc65a0fa576d7e8c9a7f8c653&authtype=sso&custid=ns315887.

APA

Daniel Macdonald, Xinyu Zhang, Siew Yee Lim, Maxime Forster, Jan Holtkamp, Andres Cuevas, & Martin C. Schubert. (2013). Applications of photoluminescence imaging to dopant and carrier concentration measurements of silicon wafers.

Chicago

Daniel Macdonald, Xinyu Zhang, Siew Yee Lim, Maxime Forster, Jan Holtkamp, Andres Cuevas, and Martin C. Schubert. 2013. “Applications of Photoluminescence Imaging to Dopant and Carrier Concentration Measurements of Silicon Wafers,” January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....c260a60fc65a0fa576d7e8c9a7f8c653&authtype=sso&custid=ns315887.