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SCUT-EPT: New Dataset and Benchmark for Offline Chinese Text Recognition in Examination Paper

Authors :
Xiaoxue Chen
Yaoxiong Huang
Zecheng Xie
Ming Zhang
Yuanzhi Zhu
Lianwen Jin
Source :
IEEE Access, Vol 7, Pp 370-382 (2019)
Publication Year :
2019
Publisher :
IEEE, 2019.

Abstract

Most existing studies and public datasets for handwritten Chinese text recognition are based on the regular documents with clean and blank background, lacking research reports for handwritten text recognition on challenging areas such as educational documents and financial bills. In this paper, we focus on examination paper text recognition and construct a challenging dataset named examination paper text (SCUT-EPT) dataset, which contains 50 000 text line images (40 000 for training and 10 000 for testing) selected from the examination papers of 2 986 volunteers. The proposed SCUT-EPT dataset presents numerous novel challenges, including character erasure, text line supplement, character/phrase switching, noised background, nonuniform word size, and unbalanced text length. In our experiments, the current advanced text recognition methods, such as convolutional recurrent neural network (CRNN) exhibits poor performance on the proposed SCUT-EPT dataset, proving the challenge and significance of the dataset. Nevertheless, through visualizing and error analysis, we observe that humans can avoid vast majority of the error predictions, which reveal the limitations and drawbacks of the current methods for handwritten Chinese text recognition (HCTR). Finally, three popular sequence transcription methods, connectionist temporal classification (CTC), attention mechanism, and cascaded attention-CTC are investigated for HCTR problem. It is interesting to observe that although the attention mechanism has been proved to be very effective in English scene text recognition, its performance is far inferior to the CTC method in the case of HCTR with large-scale character set.

Details

Language :
English
ISSN :
21693536
Volume :
7
Database :
OpenAIRE
Journal :
IEEE Access
Accession number :
edsair.doi.dedup.....c6f45c30240623c094b712816292a71e