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Influence of band structure on electron ballistic transport in silicon nanowire MOSFET’s: An atomistic study
- Source :
- Solid-State Electronics, Solid-State Electronics, Elsevier, 2006, 50 (4), pp.716-721. ⟨10.1016/j.sse.2006.03.041⟩, Solid-State Electronics, 2006, 50 (4), pp.716-721. ⟨10.1016/j.sse.2006.03.041⟩
- Publication Year :
- 2006
- Publisher :
- HAL CCSD, 2006.
-
Abstract
- This work investigates the conduction band structure of silicon nanowires, its dependence with the wire width and its influences on the electrical performances of Si nanowire-based MOSFET’s working in the ballistic regime. The energy dispersions relations for Si nanowires have been calculated using a sp 3 tight-binding model and the ballistic response of n-channel devices with a 3D Poisson–Schrodinger solver considering a mode-space approach and open boundary conditions (NEGF formalism). Results are compared with data obtained considering the parabolic bulk effective mass approximation, highlighting in this last case the overestimation of the I on current, up to 60% for the smallest (1.36 nm × 1.36 nm Si wire) devices.
- Subjects :
- 010302 applied physics
Physics
Silicon
Condensed matter physics
Nanowire
chemistry.chemical_element
02 engineering and technology
Condensed Matter::Mesoscopic Systems and Quantum Hall Effect
021001 nanoscience & nanotechnology
Condensed Matter Physics
01 natural sciences
Electronic, Optical and Magnetic Materials
Tunnel effect
Tight binding
chemistry
Ballistic conduction
0103 physical sciences
MOSFET
Materials Chemistry
Electrical and Electronic Engineering
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
0210 nano-technology
Electronic band structure
Quantum tunnelling
ComputingMilieux_MISCELLANEOUS
Subjects
Details
- Language :
- English
- ISSN :
- 00381101
- Database :
- OpenAIRE
- Journal :
- Solid-State Electronics, Solid-State Electronics, Elsevier, 2006, 50 (4), pp.716-721. ⟨10.1016/j.sse.2006.03.041⟩, Solid-State Electronics, 2006, 50 (4), pp.716-721. ⟨10.1016/j.sse.2006.03.041⟩
- Accession number :
- edsair.doi.dedup.....c88a9e8629319634db3c5440bf6be5b6