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Influence of band structure on electron ballistic transport in silicon nanowire MOSFET’s: An atomistic study

Authors :
Jean-Luc Autran
Michel Lannoo
Daniela Munteanu
K. Nehari
Marc Bescond
Nicolas Cavassilas
Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP)
Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU)
Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)
Source :
Solid-State Electronics, Solid-State Electronics, Elsevier, 2006, 50 (4), pp.716-721. ⟨10.1016/j.sse.2006.03.041⟩, Solid-State Electronics, 2006, 50 (4), pp.716-721. ⟨10.1016/j.sse.2006.03.041⟩
Publication Year :
2006
Publisher :
HAL CCSD, 2006.

Abstract

This work investigates the conduction band structure of silicon nanowires, its dependence with the wire width and its influences on the electrical performances of Si nanowire-based MOSFET’s working in the ballistic regime. The energy dispersions relations for Si nanowires have been calculated using a sp 3 tight-binding model and the ballistic response of n-channel devices with a 3D Poisson–Schrodinger solver considering a mode-space approach and open boundary conditions (NEGF formalism). Results are compared with data obtained considering the parabolic bulk effective mass approximation, highlighting in this last case the overestimation of the I on current, up to 60% for the smallest (1.36 nm × 1.36 nm Si wire) devices.

Details

Language :
English
ISSN :
00381101
Database :
OpenAIRE
Journal :
Solid-State Electronics, Solid-State Electronics, Elsevier, 2006, 50 (4), pp.716-721. ⟨10.1016/j.sse.2006.03.041⟩, Solid-State Electronics, 2006, 50 (4), pp.716-721. ⟨10.1016/j.sse.2006.03.041⟩
Accession number :
edsair.doi.dedup.....c88a9e8629319634db3c5440bf6be5b6