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Critical current measurements at electric fields in the pV m/sup -1/ regime

Authors :
W. Timms
H. Jones
D.T. Ryan
N. Killoran
Source :
IEEE Transactions on Appiled Superconductivity. 7:1455-1458
Publication Year :
1997
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 1997.

Abstract

We describe a technique for characterising sample lengths of commercial superconducting wire in closed loop configuration. This enables the measurement of critical current, as a function of applied magnetic field, at electric field criteria in the range 10/sup 6/ to 1 pV m/sup -1/ by detecting the decay of current in the closed loop. How these measurements relate to the more traditional 4 terminal measurements made on short sample coils is discussed and representative data from both NbTi and Nb/sub 3/Sn samples are presented and analysed.

Details

ISSN :
10518223
Volume :
7
Database :
OpenAIRE
Journal :
IEEE Transactions on Appiled Superconductivity
Accession number :
edsair.doi.dedup.....cc758a7d91e157bd81aec512af6edb8b
Full Text :
https://doi.org/10.1109/77.620846