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Impact of Gate Driver Signal on Static Losses for a SiC Switch Built with Normally-Off JFETs and a Schottky Diode

Authors :
Hervé Morel
Philippe Lahaye
Xavier Fonteneau
Florent Morel
Eliana Rondon-Pinilla
Ampère (AMPERE)
École Centrale de Lyon (ECL)
Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL)
Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon)
Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)
ECA-EN
entreprise
Source :
Proceedings of the 2012 IEEE Energy Conversion Congress and Exposition, ECCE, ECCE, Sep 2012, Raleigh, United States. pp.1503, ⟨10.1109/ECCE.2012.6342636⟩
Publication Year :
2012
Publisher :
HAL CCSD, 2012.

Abstract

International audience; This document shows the behaviour of a SiC switch built with Normally-Off JFETs and a Schottky diode when the JFETs are controlled with a constant gate-to-source voltage or with a constant gate current. The JFETs are used in a direct and reverse conduction. The goal of this study is to determine a gate driver signal that minimizes static losses in the switch in spite of temperature variations. Two switches are tested: the first one is built with one JFET and one diode, the second one is built with four JFETs and one diode. It has been shown that in both cases, when reverse conduction is used, a current controlled gate driver leads to lower static losses.

Details

Language :
English
Database :
OpenAIRE
Journal :
Proceedings of the 2012 IEEE Energy Conversion Congress and Exposition, ECCE, ECCE, Sep 2012, Raleigh, United States. pp.1503, ⟨10.1109/ECCE.2012.6342636⟩
Accession number :
edsair.doi.dedup.....ce1300c7df81167dd53331b138f68774
Full Text :
https://doi.org/10.1109/ECCE.2012.6342636⟩