Back to Search
Start Over
Substrate Depletion Analysis and Modeling of the High Temperature Oxidation of Binary Alloys
- Source :
- Oxidation of Metals, Oxidation of Metals, Springer Verlag, 2013, 79 (1-2), pp.81-91. ⟨10.1007/s11085-012-9353-z⟩, Oxidation of Metals, Springer Verlag, 2013, 79 (Issue : 1-2 : Special Issue : SI), pp.81-91. ⟨10.1007/s11085-012-9353-z⟩
- Publication Year :
- 2013
- Publisher :
- Springer Science and Business Media LLC, 2013.
-
Abstract
- To predict concentration changes in binary alloy due to preferential oxidation during high temperature oxidation, a model based on the flux balance of the oxidized element at the moving oxide/alloy interface has been developed. These changes are driven by the alloy oxidation rate k c . The model is numerically solved considering different initial alloy concentration profiles and a possible diffusion enhancement effect close to the alloy surface. After validating the model by comparison with Wagner’s analytical solution for Ni30wt%–Pt alloy oxidised at 850 °C, we show that the effects of an initial alloy depletion due to the presence of a passive oxide layer are cancelled after very short oxidation times. We also show that a diffusion acceleration due to work-hardening in the vicinity of the alloy surface induces an inflexion point in the depletion profile.
- Subjects :
- Materials science
Substrate depletion
Diffusion
Alloy
Kinetics
Oxide
Thermodynamics
02 engineering and technology
Substrate (electronics)
engineering.material
01 natural sciences
[SPI.MAT]Engineering Sciences [physics]/Materials
Inorganic Chemistry
[SPI]Engineering Sciences [physics]
chemistry.chemical_compound
Flux (metallurgy)
0103 physical sciences
Materials Chemistry
SEGREGATION
KINETICS
Oxidation modeling
Variable interdiffusion coefficient
010302 applied physics
Metallurgy
technology, industry, and agriculture
Metals and Alloys
PROFILES
Binary alloys
equipment and supplies
021001 nanoscience & nanotechnology
DIFFUSION
chemistry
Inflection point
engineering
METALS
0210 nano-technology
Layer (electronics)
Subjects
Details
- ISSN :
- 15734889 and 0030770X
- Volume :
- 79
- Database :
- OpenAIRE
- Journal :
- Oxidation of Metals
- Accession number :
- edsair.doi.dedup.....ced32612feb91ad75bf67079fab61a3e