Cite
Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic
MLA
M. P. Valdivia, et al. “Talbot-Lau x-Ray Deflectometer: Refraction-Based HEDP Imaging Diagnostic.” The Review of Scientific Instruments, vol. 92, no. 6, July 2021. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....cf37295bc5c31760b5471445b3d96208&authtype=sso&custid=ns315887.
APA
M. P. Valdivia, G. W. Collins, S. Muller, Ildar A. Begishev, A. Casner, R. Melean, Chad Mileham, Sallee Klein, J. Zou, V. Bouffetier, Christian Stoeckl, Farhat Beg, Dan Stutman, W. Theobald, Felipe Veloso, Sean Regan, & Milenko Vescovi. (2021). Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic. The Review of Scientific Instruments, 92(6).
Chicago
M. P. Valdivia, G. W. Collins, S. Muller, Ildar A. Begishev, A. Casner, R. Melean, Chad Mileham, et al. 2021. “Talbot-Lau x-Ray Deflectometer: Refraction-Based HEDP Imaging Diagnostic.” The Review of Scientific Instruments 92 (6). http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....cf37295bc5c31760b5471445b3d96208&authtype=sso&custid=ns315887.