Cryogenic Characterization of 22nm FDSOI CMOS Technology for Quantum Computing ICs

MLA

H. Jia, et al. “Cryogenic Characterization of 22nm FDSOI CMOS Technology for Quantum Computing ICs.” IEEE Electron Device Letters, Jan. 2019. EBSCOhost, https://doi.org/10.1109/led.2018.2880303.

APA

H. Jia, M. S. Dadash, Peter M. Asbeck, Alexandru Muller, M. Pasteanu, M. J. Gong, Raafat R. Mansour, Sorin P. Voinigescu, Sergiu Iordanescu, L. E. Gutierrez, S. Bonen, Ioana Giangu, David Harame, Utku Alakusu, W. T. Chen, Y. Duan, David R. Daughton, N. Messaoudi, Gina C. Adam, & L. Lucci. (2019). Cryogenic Characterization of 22nm FDSOI CMOS Technology for Quantum Computing ICs. IEEE Electron Device Letters. https://doi.org/10.1109/led.2018.2880303

Chicago

H. Jia, M. S. Dadash, Peter M. Asbeck, Alexandru Muller, M. Pasteanu, M. J. Gong, Raafat R. Mansour, et al. 2019. “Cryogenic Characterization of 22nm FDSOI CMOS Technology for Quantum Computing ICs.” IEEE Electron Device Letters, January. doi:10.1109/led.2018.2880303.