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Free-Space Materials Characterization by Reflection and Transmission Measurements using Frequency-by-Frequency and Multi-Frequency Algorithms
- Source :
- Electronics, Vol 7, Iss 10, p 260 (2018), Electronics, Volume 7, Issue 10
- Publication Year :
- 2018
- Publisher :
- MDPI AG, 2018.
-
Abstract
- The knowledge of the electromagnetic constitutive properties of materials is crucial in many applications. Free-space methods are widely used for this purpose, despite their inherent practical difficulties. This paper describes an affordable free-space experimental setup for the characterization of flat samples in 1&ndash<br />6 GHz in a non-anechoic environment. The extracted properties are obtained from the calibrated Scattering Parameters, using a frequency-by-frequency solution or a multi-frequency reconstruction. For the first, we describe how the Time-Domain Gating can be implemented and used for filtering the signals. For the latter, a weighting factor is introduced to balance the reflection and transmission data, allowing one to have a more favorable configuration. The different role of transmission and reflection measurements on the achievable results is analyzed with regard to experimental uncertainties and different noise scenarios. Results from the two strategies are analyzed and compared. Good agreement between simulation, measurement and literature is obtained. According to the reported results for dielectric materials, there is no need of filtering the data by a Time-Domain Gating in case of the multi-frequency approach. Experimental results for Polymethylmethacrylate (PMMA) and Polytetrafluorethylene (PTFE) samples validate both the setup and the processing.
- Subjects :
- Permittivity
Extraction algorithm
Computer Networks and Communications
Computer science
Acoustics
extraction algorithms
lcsh:TK7800-8360
02 engineering and technology
A-weighting
Dielectric
time-domain gating
Nondestructive testing
0202 electrical engineering, electronic engineering, information engineering
Scattering parameters
Electrical and Electronic Engineering
free-space calibration
business.industry
free-space method
lcsh:Electronics
non-destructive testing
020206 networking & telecommunications
Free space
material characterization
021001 nanoscience & nanotechnology
permittivity
Computer Networks and Communication
Hardware and Architecture
Control and Systems Engineering
Signal Processing
Time domain gating
conductivity
permeability
0210 nano-technology
Material properties
business
Scattering parameter
scattering parameters
Subjects
Details
- Language :
- English
- ISSN :
- 20799292
- Volume :
- 7
- Issue :
- 10
- Database :
- OpenAIRE
- Journal :
- Electronics
- Accession number :
- edsair.doi.dedup.....d8ae1b46bfb82b0cbd0f2c93eb64116c