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Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)
- Source :
- Optics Express. 14:11598
- Publication Year :
- 2006
- Publisher :
- The Optical Society, 2006.
-
Abstract
- Digital speckle pattern interferometry (DSPI) and digital shearography (DS) are well known optical tools for qualitative as well as quantitative measurements of displacement components and its derivatives of engineering structures subjected either static or dynamic load. Spatial phase shifting (SPS) technique is useful for extracting quantitative displacement data from the system with only two frames. Optical configurations for DSPI and DS with a double aperture mask in front of the imaging lens for spatial phase shifting are proposed in this paper for the measurement of out-of-plane displacement and its first order derivative (slope) respectively. An error compensating four-phase step algorithm is used for quantitative fringe analysis. � 2006 Optical Society of America.
- Subjects :
- Optical instrument lenses
Computer science
business.industry
Aperture
Optical tools
Speckle noise
Atomic and Molecular Physics, and Optics
Displacement (vector)
Interferometry
Speckle pattern
Optics
Speckle
Shearography
Pattern recognition
Electronic speckle pattern interferometry
Spatial phase shifting (SPS)
Digital devices
Speckle imaging
Spatial frequency
Phase shift
Digital shearography (DS)
business
Digital speckle pattern interferometry (DSPI)
Subjects
Details
- ISSN :
- 10944087
- Volume :
- 14
- Database :
- OpenAIRE
- Journal :
- Optics Express
- Accession number :
- edsair.doi.dedup.....d9e58d02f512438958e524365168b43a