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A Multi-Mode Signature Analyzer for Analog and Mixed Circuits

Authors :
Michel Renovell
Yves Bertrand
Marcelo Lubaszewski
Salvador Mir
Florence Azaïs
Conception et Test de Systèmes MICroélectroniques (SysMIC)
Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
Departamento de Engenharia Eletrica (UFRGS)
Universidade Federal do Rio Grande do Sul [Porto Alegre] (UFRGS)
Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA)
Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)
Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)
Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA)
Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)
Source :
VLSI: Integrated Systems on Silicon ISBN: 9781475769494, 9th International Conference on Very Large Scale Integration, VLSI: Integrated Systems on Silicon, VLSI: Integrated Systems on Silicon, Aug 1997, Gramado, Brazil. pp.65-76, ⟨10.1007/978-0-387-35311-1_6⟩
Publication Year :
1997
Publisher :
Springer US, 1997.

Abstract

International audience; In this paper a multi-mode signature analyser is proposed to be built into analog and mixed-signal integrated circuits. The analyser circuitry is based on analog integrators and can perform transient (with one integrator) and frequency (with two integrators) response compaction. The area overhead incurred can be very low, since the same signature analyser can be shared by several analog macros. Besides that, whenever integrators are available on-chip for functional purposes, they can be shared with the testing circuitry. Experiments carried on a Sallen-Key (transient response compaction) and on a biquad filter (frequency response compaction) showed that a very high coverage of catastrophic and pammetric faults can be obtained by using the proposed multi-mode signature analyser.

Details

ISBN :
978-1-4757-6949-4
ISBNs :
9781475769494
Database :
OpenAIRE
Journal :
VLSI: Integrated Systems on Silicon ISBN: 9781475769494, 9th International Conference on Very Large Scale Integration, VLSI: Integrated Systems on Silicon, VLSI: Integrated Systems on Silicon, Aug 1997, Gramado, Brazil. pp.65-76, ⟨10.1007/978-0-387-35311-1_6⟩
Accession number :
edsair.doi.dedup.....db264d99bec8c86327fa8efe1afe8f72
Full Text :
https://doi.org/10.1007/978-0-387-35311-1_6