Exploiting the switching dynamics of HfO 2 -based ReRAM devices for reliable analog memristive behavior

Authors :: Cüppers, Stefan
Menzel, S.
Bengel, C.
Hardtdegen, Alexander
Von Witzleben, Moritz Alexander
Böttger, Ulrich
Waser, R.
Hoffmann-Eifert, S.
Source :: APL materials 7(9), 091105 (2019). doi:10.1063/1.5108654, APL Materials
Publication Year :: 2019
Publisher :: RWTH Aachen University, 2019.
Abstract: APL materials 7(9), 091105 (2019). doi:10.1063/1.5108654<br />Published by AIP Publ., Melville, NY

Language :: English
Database :: OpenAIRE
Journal :: APL materials 7(9), 091105 (2019). doi:10.1063/1.5108654, APL Materials
Accession number :: edsair.doi.dedup.....e5338e24a787735efb3ca01a13e35e9a
Full Text :: https://doi.org/10.18154/rwth-2019-09861

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