Calculating Kelvin force microscopy signals from static force fields

International audience; We present an analytical formula to achieve numerical simulations of Kelvin force microscopyKFM signals from static force fields, which can be employed to describe amplitude-modulation orfrequency-modulation KFM, as well as simultaneous topography and KFM modes for which the tipprobe exhibits a nonzero oscillation during KFM imaging. This model is shown to account forside-capacitance and nonlinear effects taking place in KFM experiments, and can therefore be usedconveniently to extract quantitative information from KFM experiments at the nanoscale