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Calculating Kelvin force microscopy signals from static force fields
- Source :
- Applied Physics Letters, Applied Physics Letters, American Institute of Physics, 2010, 96, pp.103119-1-3. ⟨10.1063/1.3323098⟩, Applied Physics Letters, 2010, 96, pp.103119-1-3. ⟨10.1063/1.3323098⟩
- Publication Year :
- 2010
- Publisher :
- HAL CCSD, 2010.
-
Abstract
- International audience; We present an analytical formula to achieve numerical simulations of Kelvin force microscopyKFM signals from static force fields, which can be employed to describe amplitude-modulation orfrequency-modulation KFM, as well as simultaneous topography and KFM modes for which the tipprobe exhibits a nonzero oscillation during KFM imaging. This model is shown to account forside-capacitance and nonlinear effects taking place in KFM experiments, and can therefore be usedconveniently to extract quantitative information from KFM experiments at the nanoscale
- Subjects :
- 010302 applied physics
Physics
Physics and Astronomy (miscellaneous)
Oscillation
Atomic force microscopy
02 engineering and technology
Static force
021001 nanoscience & nanotechnology
Electrostatics
01 natural sciences
Capacitance
Computational physics
[SPI]Engineering Sciences [physics]
Nonlinear system
Classical mechanics
0103 physical sciences
Microscopy
0210 nano-technology
Nanoscopic scale
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Database :
- OpenAIRE
- Journal :
- Applied Physics Letters, Applied Physics Letters, American Institute of Physics, 2010, 96, pp.103119-1-3. ⟨10.1063/1.3323098⟩, Applied Physics Letters, 2010, 96, pp.103119-1-3. ⟨10.1063/1.3323098⟩
- Accession number :
- edsair.doi.dedup.....e7994fd75671e1282677162a7db6d019