Universal Reset Characteristics of Unipolar and Bipolar Metal-Oxide RRAM

MLA

Daniele Ielmini, et al. “Universal Reset Characteristics of Unipolar and Bipolar Metal-Oxide RRAM.” IEEE Transactions on Electron Devices, vol. 58, Oct. 2011, pp. 3246–53. EBSCOhost, https://doi.org/10.1109/ted.2011.2161088.

APA

Daniele Ielmini, Carlo Cagli, & Federico Nardi. (2011). Universal Reset Characteristics of Unipolar and Bipolar Metal-Oxide RRAM. IEEE Transactions on Electron Devices, 58, 3246–3253. https://doi.org/10.1109/ted.2011.2161088

Chicago

Daniele Ielmini, Carlo Cagli, and Federico Nardi. 2011. “Universal Reset Characteristics of Unipolar and Bipolar Metal-Oxide RRAM.” IEEE Transactions on Electron Devices 58 (October): 3246–53. doi:10.1109/ted.2011.2161088.