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On the evolution of oxidative etching of few layer graphene (FLG) in FLG /TiO2 nanocomposites. Interfacial dipole signature and chemical shift in C1s X-ray photoemission spectra

Authors :
Hamza El Marouazi
Valérie Keller
Izabela Janowska
Institut de chimie et procédés pour l'énergie, l'environnement et la santé (ICPEES)
Université de Strasbourg (UNISTRA)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Matériaux et Nanosciences Grand-Est (MNGE)
Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)
This work was supported by the ANR program (PHOTER) and statutory CNRS/Unistra funding.
KELLER, Valérie
Source :
Surfaces and Interfaces, Surfaces and Interfaces, 2022, pp.102510. ⟨10.1016/j.surfin.2022.102510⟩
Publication Year :
2022
Publisher :
HAL CCSD, 2022.

Abstract

We present the effect of oxidative etching in FLG/TiO$_2$ hybrids on FLG edges chemistry/morphology addressing also the catalytic activity of TiO$_2$ NPs. According to the XPS and TGA analysis the oxidation degree strongly depends on TiO$_2$:FLG ratio. The preparation of two series of FLG/TiO$_2$ hybrids via sol-gel method and in-situ oxidation permitted to correctly describe and distinguish the chemical composition, core shift and charge distribution in C1s XPS with Tip peak as reference. Such analysis is challenging in carbon materials due the overlapping of C1s peaks from the sample and adventitious carbon reference. We claim the formation of interfacial dipole as possible direct signature of charge transfer from TiO$_2$ to FLG. A downward shift of C1s (sp$^2$C) up to 1.4 eV is measured and contributions of non sp$^2$C are determined in the composites. The modifications related to the oxidation are supported by TEM/SEM observations, and referred to non-catalytic oxidation and oxidation in mechanically mixed components. KEYWORDS: oxidative etching, graphene edges, TiO$_2$ catalyst, interfacial dipole, XPS, charge transfer

Details

Language :
English
ISSN :
24680230
Database :
OpenAIRE
Journal :
Surfaces and Interfaces, Surfaces and Interfaces, 2022, pp.102510. ⟨10.1016/j.surfin.2022.102510⟩
Accession number :
edsair.doi.dedup.....ec5829b78dbe27c92ced5a59f5871161
Full Text :
https://doi.org/10.1016/j.surfin.2022.102510⟩