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Evidence of liquid phase during laser-induced periodic surface structures formation induced by accumulative ultraviolet picosecond laser beam
- Source :
- Applied Physics Letters, Applied Physics Letters, American Institute of Physics, 2015, 107 (19), pp.193105. ⟨10.1063/1.4935413⟩, Applied Physics Letters, American Institute of Physics, 2015, ⟨10.1063/1.4935413⟩
- Publication Year :
- 2015
- Publisher :
- HAL CCSD, 2015.
-
Abstract
- International audience; Laser-induced periodic surface structures (LIPSS) were formed on Cu/Si or Cu/glass thin films using Nd:YAG laser beam (40 ps, 10Hz, and 30mJ/cm2). The study of ablation threshold is always achieved over melting when the variation of the number of pulses increases from 1 to 1000. But the incubation effect is leading to reduce the threshold of melting as increasing the number of laser pulse. Also, real time reflectivity signals exhibit typical behavior to stress the formation of a liquid phase during the laser-processing regime and helps to determine the threshold of soft ablation.Atomic Force Microscopy (AFM) analyses have shown the topology of the micro-crater containing regular spikes with different height. Transmission Electron Microscopy (TEM) allows finally to show three distinguished zones in the close region of isolated protrusions. The central zone is a typical crystallized area of few nanometers surrounded by a mixed poly-crystalline and amorphous area. Finally, in the region far from the protrusion zone, Cu film shows an amorphous structure. The real time reflectivity, AFM, and HR-TEM analyses evidence the formation of a liquid phaseduring the LIPSS formation in the picosecond regime. VC 2015 AIP Publishing LLC
- Subjects :
- [PHYS]Physics [physics]
Materials science
Physics and Astronomy (miscellaneous)
business.industry
[CHIM.MATE]Chemical Sciences/Material chemistry
medicine.disease_cause
Laser
Molecular physics
law.invention
Amorphous solid
Stress (mechanics)
[SPI]Engineering Sciences [physics]
Optics
Transmission electron microscopy
law
medicine
[SPI.GPROC]Engineering Sciences [physics]/Chemical and Process Engineering
Thin film
Crystallization
business
Ultraviolet
Beam (structure)
ComputingMilieux_MISCELLANEOUS
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Database :
- OpenAIRE
- Journal :
- Applied Physics Letters, Applied Physics Letters, American Institute of Physics, 2015, 107 (19), pp.193105. ⟨10.1063/1.4935413⟩, Applied Physics Letters, American Institute of Physics, 2015, ⟨10.1063/1.4935413⟩
- Accession number :
- edsair.doi.dedup.....f33c01d08f5be9a611383f52aca51973