Effect of Copper Foil Crystal Orientation on Graphene Quality Synthesized by Chemical Vapor Deposition

Line defects such as wrinkles are believed to change the electrical properties of graphene. However, they are often observed in graphene grown via chemical vapor deposition; hence, it is important to study the impact of the substrate condition on graphene quality. In this work, graphene was synthesized on various copper domains with different crystal orientations and surface morphologies. During the synthesis process, three typical crystal orientations were obtained Cu(001), Cu(101), and Cu(111) showing different surface morphologies with various densities of wrinkles. Graphene wrinkles along with copper wrinkles were studied using atomic force microscopy and Kelvin probe force microscopy. The quality of graphene on different crystal orientations and morphologies was evaluated as well. It was found that different crystallographic orientations lead to different degrees of wrinkle and roughness. In addition, these wrinkle defects exhibited characteristic surface potential variations and the density of substrate wrinkles was closely associated with the uniformity of graphene and led to a disordered structure and low crystallinity.