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The center for production of single-photon emitters at the electrostatic-deflector line of the Tandem accelerator of LABEC (Florence)

Authors :
Caroline Czelusniac
Stefano Lagomarsino
Federico A. Gorelli
N. Gelli
Francesco Taccetti
Assegid Mengistu Flatae
Lorenzo Giuntini
M. Massi
Massimo Chiari
Mario Santoro
Mario Agio
Silvio Sciortino
Source :
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 422 (2018): 31–40. doi:10.1016/j.nimb.2018.02.020, info:cnr-pdr/source/autori:Stefano Lagomarsino, Silvio Sciortino, Nicla Gelli, Assegid M. Flatae, Federico Gorelli, Mario Santoro, Massimo Chiari, Caroline Czelusniac, Mirko Massi, Francesco Taccetti, Mario Agio, Lorenzo Giuntini/titolo:The center for production of single-photon emitters at the electrostaticdeflector line of the Tandem accelerator of LABEC (Florence)/doi:10.1016%2Fj.nimb.2018.02.020/rivista:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (Print)/anno:2018/pagina_da:31/pagina_a:40/intervallo_pagine:31–40/volume:422
Publication Year :
2018
Publisher :
Elsevier BV, 2018.

Abstract

The line for the pulsed beam of the 3 MeV Tandetron accelerator at LABEC (Florence) has been upgraded for ion implantation experiments aiming at the fabrication of single-photon emitters in a solid-state matrix. A system based on Al attenuators has been calibrated in order to extend the energy range of the implanted ions from MeV down to the tens of keV. A new motorized XY stage has been installed in the implantation chamber for achieving ultra-fine control on the position of each implanted ion, allowing to reach the scale imposed by lateral straggling. A set-up for the activation of the implanted ions has been developed, based on an annealing furnace operating under controlled high-vacuum conditions. The first experiments have been performed with silicon ions implanted in diamond and the luminescent signal of the silicon-vacancy (SiV) center, peaked at 738 nm, has been observed for a wide range of implantation fluences (108 ÷ 1015 cm−2) and implantation depths (from a few nm to 2.4 µm). Studies on the efficiency of the annealing process have been performed and the activation yield has been measured to range from 1% to 3%. The implantation and annealing facility has thus been tuned for the production of SiV centers in diamond, but is in principle suitable for other ion species and solid-state matrices.

Details

ISSN :
0168583X
Volume :
422
Database :
OpenAIRE
Journal :
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Accession number :
edsair.doi.dedup.....fb1c96965a62f4762014980a85ac40ca
Full Text :
https://doi.org/10.1016/j.nimb.2018.02.020