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The wave optical whole process design of the soft X-ray interference lithography beamline at SSRF

Authors :
Yanqing Wu
Renzhong Tai
Shumin Yang
Liansheng Wang
Chaofan Xue
Yong Wang
Xiangyu Meng
Jun Zhao
Source :
Journal of Synchrotron Radiation. 25:1869-1876
Publication Year :
2018
Publisher :
International Union of Crystallography (IUCr), 2018.

Abstract

A new spatially coherent beamline has been designed and constructed at the Shanghai Synchrotron Radiation Facility. Here, the design of the beamline is introduced and the spatial coherence is analyzed throughout the whole process by wave optics. The simulation results show good spatial coherence at the endstation and have been proven by experiment results.

Details

ISSN :
16005775
Volume :
25
Database :
OpenAIRE
Journal :
Journal of Synchrotron Radiation
Accession number :
edsair.doi.dedup.....fea1015ab72b70f814f9343b9e9e3bea
Full Text :
https://doi.org/10.1107/s1600577518012833