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The wave optical whole process design of the soft X-ray interference lithography beamline at SSRF
- Source :
- Journal of Synchrotron Radiation. 25:1869-1876
- Publication Year :
- 2018
- Publisher :
- International Union of Crystallography (IUCr), 2018.
-
Abstract
- A new spatially coherent beamline has been designed and constructed at the Shanghai Synchrotron Radiation Facility. Here, the design of the beamline is introduced and the spatial coherence is analyzed throughout the whole process by wave optics. The simulation results show good spatial coherence at the endstation and have been proven by experiment results.
- Subjects :
- Physics
Nuclear and High Energy Physics
Soft x ray
Radiation
business.industry
Process (computing)
Synchrotron radiation
Process design
02 engineering and technology
021001 nanoscience & nanotechnology
Physical optics
01 natural sciences
Interference lithography
010309 optics
Spatial coherence
Optics
Beamline
0103 physical sciences
0210 nano-technology
business
Instrumentation
Subjects
Details
- ISSN :
- 16005775
- Volume :
- 25
- Database :
- OpenAIRE
- Journal :
- Journal of Synchrotron Radiation
- Accession number :
- edsair.doi.dedup.....fea1015ab72b70f814f9343b9e9e3bea
- Full Text :
- https://doi.org/10.1107/s1600577518012833