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Insight into carrier lifetime impact on band-modulation devices

Authors :
Sorin Cristoloveanu
Sebastien Martinie
Maryline Bawedin
Hyung Jin Park
Hassan El Dirani
Yuan Taur
Jean-Charles Barbe
Kyung Hwa Lee
Joris Lacord
Yue Xu
Mukta Singh Parihar
Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC )
Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI)
Direction de Recherche Technologique (CEA) (DRT (CEA))
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
Nanjing University of Posts and Telecommunications [Nanjing] (NJUPT)
University of California [San Diego] (UC San Diego)
University of California
European Project: 687931,H2020,H2020-ICT-2015,REMINDER(2016)
University of California (UC)
Source :
Solid-State Electronics, Solid-State Electronics, Elsevier, 2018, 143, pp.41-48. ⟨10.1016/j.sse.2017.12.007⟩, Solid-State Electronics, 2018, 143, pp.41-48. ⟨10.1016/j.sse.2017.12.007⟩

Abstract

International audience; A systematic study to model and characterize the band-modulation Z2-FET device is developed bringing light to the relevance of the carrier lifetime influence. This work provides guidelines to optimize the Z2-FETs for sharp switching, ESD protection, and 1T-DRAM applications. Lower carrier lifetime in the Z2-FET helps in attaining the sharp switch. We provide new insights into the correlation between generation/recombination, diffusion, electrostatic barriers and carrier lifetime.

Details

Language :
English
ISSN :
00381101
Volume :
143
Database :
OpenAIRE
Journal :
Solid-State Electronics
Accession number :
edsair.doi.dedup.....fece3717f934425bbd9d6d589ff26f52
Full Text :
https://doi.org/10.1016/j.sse.2017.12.007