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ARTIFICIALLY INDUCED DEVELOPMENTAL DEFECTS IN SHEEP ENAMEL EXAMINED BY SCANNING ELECTRON-MICROSCOPY

Authors :
PURDELLLEWIS, DJ
SUCKLING, GW
TRILLER, M
JONGEBLOED, WL
Electron Microscopy
Source :
Journal de biologie buccale, 15(2), 119-124
Publication Year :
1987

Details

Language :
English
ISSN :
03013952
Database :
OpenAIRE
Journal :
Journal de biologie buccale, 15(2), 119-124
Accession number :
edsair.narcis........167e8d14c7ef8498163cba772fe6d73d