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Bulk and contact 1/f noise in GaN TLM structures

Authors :
Feyaerts, R.
Vandamme, L.K.J.
Trefan, G.
Krämer, M.C.J.C.M.
Zellweger, C.
Ryssel, H.
Wachutka, G.
Grunbacher, H.
Integrated Circuits
Photonic Integration
Source :
31th European Solid-State Device Research Conference, 355-358, STARTPAGE=355;ENDPAGE=358;TITLE=31th European Solid-State Device Research Conference
Publication Year :
2001
Publisher :
Frontier Group, 2001.

Details

Language :
English
Database :
OpenAIRE
Journal :
31th European Solid-State Device Research Conference, 355-358, STARTPAGE=355;ENDPAGE=358;TITLE=31th European Solid-State Device Research Conference
Accession number :
edsair.narcis........44167c5ad06c8295789fdc9e244eae08

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