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Reliability Analysis of Tantalum Capacitors for High Temperature Application

Authors :
Dehbi, A.
Wondrak, W.
Ousten, Yves
Danto, Yves
Import, Ims
Publication Year :
2002
Publisher :
HAL CCSD, 2002.

Subjects

Subjects :
[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.od.......166..cea84a55c08c13305e2fc57b46a27028

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