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In situ UHVEM study of {113}-defect formation in Si nanowires

Authors :
Vanhellemont, Jan
Anada, Satoshi
Yasuda, Hidehiro
Bender, Hugo
Rooyackers, Rita
Vandooren, Anne
Source :
Microscopy of semiconducting materials (MSM-XIX) : programme and abstracts
Publication Year :
2015
Publisher :
Institute of Physics (IOP), 2015.

Subjects

Subjects :
Physics and Astronomy

Details

Language :
English
Database :
OpenAIRE
Journal :
Microscopy of semiconducting materials (MSM-XIX) : programme and abstracts
Accession number :
edsair.od.......330..e3ff81a780330f39d0df3f71d56d7d10