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In situ UHVEM study of {113}-defect formation in Si nanowires
- Source :
- Microscopy of semiconducting materials (MSM-XIX) : programme and abstracts
- Publication Year :
- 2015
- Publisher :
- Institute of Physics (IOP), 2015.
- Subjects :
- Physics and Astronomy
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Microscopy of semiconducting materials (MSM-XIX) : programme and abstracts
- Accession number :
- edsair.od.......330..e3ff81a780330f39d0df3f71d56d7d10