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Enhanced field-emission investigation of aluminum

Authors :
Renner, Christoph
Niedermann, Philipp
Fischer, Oystein
Source :
IEEE Transactions on Electrical Insulation, Vol. 24, No 6 (1989) pp. 911-916
Publication Year :
1989

Abstract

Enhanced field emission on high-purity aluminum has been investigated. The current/voltage characteristic (Fowler-Nordheim plot), the chemical composition as determined by Auger electron spectroscopy and X-ray microprobe analysis, and the topography of field-emitting sites were studied locally. In addition, results on the evolution of these sites under heat treatment, Ar/sup +/ sputtering, and exposure to atmosphere are presented. The field-emitting sites on aluminum are all related to particles approximately 30 mu m in size standing on the surface. The average emission over 1-cm/sup 2/ areas is little affected by the abovementioned surface treatments.

Subjects

Subjects :
ddc:500.2

Details

Language :
English
ISSN :
00189367
Database :
OpenAIRE
Journal :
IEEE Transactions on Electrical Insulation, Vol. 24, No 6 (1989) pp. 911-916
Accession number :
edsair.od......1400..7749e3ef8253a8e8e322fd0da6a30f49