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Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison

Authors :
Alfeld, Matthias
Vekemans, Bart
Janssens, Koen
Falkenberg, G.
Broekaert, J.A.C.
Gao, N.
Gibson, D.
Source :
HASYLAB Jahresbericht 2006 / Schneider, J. [edit.]
Publication Year :
2007

Details

Language :
English
Database :
OpenAIRE
Journal :
HASYLAB Jahresbericht 2006 / Schneider, J. [edit.]
Accession number :
edsair.od......2097..f3999bee331976873d79f853785d955f

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