EMF exposure modelling using stochastic geometry

Authors :: Gontier, Quentin
Petrillo, Luca
Nguyen, Trung-Hien
Oestges, Claude
Wiart, Joe JW
De Doncker, Philippe
Source :: Proc. of the 5th workshop on Uncertainty Modelling for ElectroMagnetic Applications, UMEMA
Publication Year :: 2020
Abstract: info:eu-repo/semantics/published

Language :: English
Database :: OpenAIRE
Journal :: Proc. of the 5th workshop on Uncertainty Modelling for ElectroMagnetic Applications, UMEMA
Accession number :: edsair.od......2101..4489f3ce5d8295bb8d21efbd727f008e

Tools