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Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy
- Source :
- Proceedings I of the 28st Conference STUDENT EEICT 2022: General papers. s. 409-414. ISBN 978-80-214-6029-4
- Publication Year :
- 2022
- Publisher :
- Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií, 2022.
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Abstract
- The main object of this study will be based on producing and characterization of lithographic thin–film structures produced based electrochromic materials. Atomic force microscopy will be used as a main method of evaluation the morphology of lithographic structures. The optical properties of eslectrochromic materials will be analyze using scanning near–field optical microscopy by applying different electrical potential.
- Subjects :
- electrochromic materials
thin–films
SNOM
AFM
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Proceedings I of the 28st Conference STUDENT EEICT 2022: General papers. s. 409-414. ISBN 978-80-214-6029-4
- Accession number :
- edsair.od......2852..15db0ec974654e5276d55c1f39ff3608