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Reliability of Gallium Nitride High Electron Mobility Transistors

Authors :
Meneghesso, Gaudenzio
Zanoni, Enrico
Publication Year :
2012

Subjects

Subjects :
Gallium Nitride
reliability
degradation

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.od......3657..64da54bf45fa1eb8a34cbe6a68c0f5a6

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Authors Abstract Subjects Details