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Reliability issues in optoelectronics devices

Authors :
Meneghini, Matteo
Meneghesso, Gaudenzio
Zanoni, Enrico
Publication Year :
2011

Subjects

Subjects :
Gallium Nitride
HEMT
reliability

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.od......3657..a1f0f2535526424ae0e2acc1ea161e48

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Authors Abstract Subjects Details