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Combined electro-optical analysis of the degradation of InGaN-based laser diodes

Authors :
Meneghini, Matteo
Trivellin, Nicola
Meneghesso, Gaudenzio
Zanoni, Enrico
Orita, K.
Takigawa, S.
Tanaka, T.
Ueda, D.
Publication Year :
2010

Subjects

Subjects :
reliability
Blu ray
Laser diode
InGaN

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.od......3657..bffd9be792ea71c54d917c79554d7388

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Authors Abstract Subjects Details