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Automated Determination of Device Noise Parameters Using Multi-Frequency, Source- Pull Data

Authors :
Colangeli, S
Ciccognani, W
Palomba, M
Limiti, E
Publication Year :
2012
Publisher :
IEEE, 2012.

Subjects

Subjects :
Whole process Engineering main heading: Microwave integrated circuits
Constant parameters
Device noise
Noise parameters
Multi frequency
Single-frequency
Source-pull
Settore ING-INF/01 - Elettronica
Active devices

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.od......3667..40650c46f47ff452464a629cc6ada2fd

Tools

Authors Abstract Subjects Details