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Improving the soft X-ray reflectivity of Cr/Ti multilayers by co-deposition of B

Authors :
Jingtao, Zhu
Jiayi, Zhang
Haochuan, Li
Yuchun, Tu
Jinwen, Chen
Hongchang, Wang
Sarnjeet S, Dhesi
Mingqi, Cui
Jie, Zhu
Philippe, Jonnard
Source :
Journal of synchrotron radiation. 27(Pt 6)
Publication Year :
2020

Abstract

The `water window', covering 2.4-4.4 nm, is an important wavelength range particularly essential to biology research. Cr/Ti multilayers are one of the promising reflecting elements in this region because the near-normal-incidence reflectivity is theoretically as high as 64% at 2.73 nm. However, due to multilayer imperfections, the reported reflectivity is lower than 3% for near-normal incidence. Here, B and C were intentionally incorporated into ultra-thin Cr/Ti soft X-ray multilayers by co-deposition of B

Details

ISSN :
16005775
Volume :
27
Issue :
Pt 6
Database :
OpenAIRE
Journal :
Journal of synchrotron radiation
Accession number :
edsair.pmid..........30a2ee6300eb774b7252057cd350708d