Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization

MLA

Nicolas, Brodusch, et al. “Acquisition Parameters Optimization of a Transmission Electron Forward Scatter Diffraction System in a Cold-Field Emission Scanning Electron Microscope for Nanomaterials Characterization.” Scanning, vol. 35, no. 6, Oct. 2012. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.pmid..........a0b9eee570eb6c2e97c92528d63530ad&authtype=sso&custid=ns315887.

APA

Nicolas, B., Hendrix, D., Michel, T., & Raynald, G. (2012). Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization. Scanning, 35(6).

Chicago

Nicolas, Brodusch, Demers Hendrix, Trudeau Michel, and Gauvin Raynald. 2012. “Acquisition Parameters Optimization of a Transmission Electron Forward Scatter Diffraction System in a Cold-Field Emission Scanning Electron Microscope for Nanomaterials Characterization.” Scanning 35 (6). http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.pmid..........a0b9eee570eb6c2e97c92528d63530ad&authtype=sso&custid=ns315887.