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Strong Interfacial Charge Trapping in Ultrathin SrRuO

Authors :
Jung-Woo, Lee
Jiyeong, Kim
Kitae, Eom
Jaeyoung, Jeon
Young Chul, Kim
Hwan Sik, Kim
Yeong Hwan, Ahn
Sungkyu, Kim
Chang-Beom, Eom
Hyungwoo, Lee
Source :
The journal of physical chemistry letters. 13(24)
Publication Year :
2022

Abstract

SrRuO

Details

ISSN :
19487185
Volume :
13
Issue :
24
Database :
OpenAIRE
Journal :
The journal of physical chemistry letters
Accession number :
edsair.pmid..........c7a5656767a7478d6b76b8b16f7392c9