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Phase Change Observed in Ultrathin Ba0.5Sr0.5TiO3 Films by in-situ Resonant Photoemission Spectroscopy
- Source :
- Appl. Phys. Lett. 90, 222909 (2007)
- Publication Year :
- 2007
-
Abstract
- Epitaxial Ba0.5Sr0.5TiO3 thin films were prepared on Nb-doped SrTiO3 (100)substrates by the pulsed laser deposition technique, and were studied by measuring the Ti 2p - 3d resonant photoemission spectra in the valence-band region as a function of film thickness, both at room temperature and low temperature. Our results demonstrated an abrupt variation in the spectral structures between 2.8 nm (~7 monolayers) and 2.0 nm (~5 monolayers) Ba0.5Sr0.5TiO3 films, suggesting that there exists a critical thickness for phase change in the range of 2.0 nm to 2.8 nm. This may be ascribed mainly to the intrinsic size effects.<br />Comment: 13 pages, 4 figures
- Subjects :
- Condensed Matter - Materials Science
Subjects
Details
- Database :
- arXiv
- Journal :
- Appl. Phys. Lett. 90, 222909 (2007)
- Publication Type :
- Report
- Accession number :
- edsarx.0705.3675
- Document Type :
- Working Paper
- Full Text :
- https://doi.org/10.1063/1.2745249