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Remote hole-doping of Mott insulators on the nanometer scale

Authors :
Takizawa, M.
Hotta, Y.
Susaki, T.
Ishida, Y.
Wadati, H.
Takata, Y.
Horiba, K.
Matsunami, M.
Shin, S.
Yabashi, M.
Tamasaku, K.
Nishino, N.
Ishikawa, T.
Fujimori, A.
Hwang, H. Y.
Source :
Phys. Rev. Lett. 102, 236401 (2009)
Publication Year :
2008

Abstract

At interfaces between polar and nonpolar perovskite oxides, an unusual electron-doping has been previously observed, due to electronic reconstructions. We report on remote hole-doping at an interface composed of only polar layers, revealed by high-resolution hard x-ray core-level photoemission spectroscopy. In LaAlO3/LaVO3/LaAlO3 trilayers, the vanadium valence systematically evolves from the bulk value of V3+ to higher oxidation states with decreasing LaAlO3 cap layer thickness. These results provide a synthetic approach to hole-doping transition metal oxide heterointerfaces without invoking a polar discontinuity.

Details

Database :
arXiv
Journal :
Phys. Rev. Lett. 102, 236401 (2009)
Publication Type :
Report
Accession number :
edsarx.0806.2191
Document Type :
Working Paper